I/O TEST METHODOLOGY

Details for Australian Patent Application No. 2002343487 (hide)

Owner SUN MICROSYSTEMS, INC.

Inventors FONG, Wai; YUAN, Leo; SMITH, Brian, L.; CHEN, Cecilia, T.; JONG, Jyh-Ming

Pub. Number AU-A-2002343487

PCT Number PCT/US02/32150

PCT Pub. Number WO2003/036311

Priority 09/999,877 25.10.01 US

Filing date 9 October 2002

Wipo publication date 6 May 2003

International Classifications

G01R 031/00 Arrangements for testing electric properties

Event Publications

27 February 2003 Complete Application Filed

  Priority application(s): 09/999,877 25.10.01 US

3 July 2003 Application Open to Public Inspection

  Published as AU-A-2002343487

15 July 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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