BUILT-IN SELF-TESTING FOR DOUBLE DATA RATE INPUT/OUTPUT

Details for Australian Patent Application No. 2002342247 (hide)

Owner SUN MICROSYSTEMS, INC.

Inventors SANGHANI, Amit

Pub. Number AU-A-2002342247

PCT Number PCT/US02/34984

PCT Pub. Number WO2003/046925

Priority 09/996,866 27.11.01 US

Filing date 31 October 2002

Wipo publication date 10 June 2003

International Classifications

G11C 029/00 Checking stores for correct operation

G01R 031/317 Arrangements for testing electric properties

Event Publications

27 February 2003 Complete Application Filed

  Priority application(s): 09/996,866 27.11.01 US

21 August 2003 Application Open to Public Inspection

  Published as AU-A-2002342247

12 August 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2002342248-CELESTIAL TRACKING APPARATUS AND METHOD OF CONTROLLING WIND STOW THEREFOR

2002342246-METHOD OF USING PERSONAL CARE COMPOSITIONS CONTAINING A HIGH DENSITY, WATER DISINTEGRATABLE, POLYMERIC FOAM