METHOD TO OPTIMIZE TEST DATA

Details for Australian Patent Application No. 2002342059 (hide)

Owner LOCKHEED MARTIN CORPORATION

Inventors VANDERWIEL, Robert, W.

Pub. Number AU-A-2002342059

PCT Number PCT/US02/33084

PCT Pub. Number WO2003/034167

Priority 09/978,817 15.10.01 US

Filing date 15 October 2002

Wipo publication date 28 April 2003

International Classifications

G05B 023/02 Testing or monitoring of control systems or parts thereof - Electric testing or monitoring

B64F 005/00 Designing, manufacturing, assembling, cleaning, maintaining, or repairing aircraft, not otherwise provided for

Event Publications

27 February 2003 Complete Application Filed

  Priority application(s): 09/978,817 15.10.01 US

3 July 2003 Application Open to Public Inspection

  Published as AU-A-2002342059

1 July 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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