A mass spectrometer for simultaneous detection of reflected and direct ions

Details for Australian Patent Application No. 2002341760 (hide)

International Classifications

Event Publications

27 February 2003 Complete Application Filed

Priority application(s): 60/323,563 20.09.01 US

5 June 2003 Application Open to Public Inspection

Published as AU-A-2002341760

23 February 2006 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(a). A direction to request examination has been given for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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