DEVICE FOR FIXING A MEASURING PROBE FOR A RASTER SCANNING PROBE MICROSCOPE

Details for Australian Patent Application No. 2002339335 (hide)

Owner JPK INSTRUMENTS AG

Inventors SUNWOLDT, Olaf; HASCHKE, Heiko

Pub. Number AU-A-2002339335

PCT Number PCT/DE02/03689

PCT Pub. Number WO2003/028036

Priority 101 48 322.8 24.09.01 DE

Filing date 24 September 2002

Wipo publication date 7 April 2003

International Classifications

G12B 021/00

G01B 007/34 Measuring arrangements characterised by the use of electric or magnetic means - for measuring roughness or irregularity of surfaces

G01N 027/00 Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means

G11B 009/00 Recording or reproducing using a method or means not covered by one of the main groups

Event Publications

27 February 2003 Complete Application Filed

  Priority application(s): 101 48 322.8 24.09.01 DE

26 June 2003 Application Open to Public Inspection

  Published as AU-A-2002339335

17 June 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2002339336-METHOD AND DEVICE FOR ANALYSING A SAMPLE BY MEANS OF A RASTER SCANNING PROBE MICROSCOPE

2002339334-DEVICE AND METHOD FOR SCANNING PROBE MICROSCOPE