X-ray fluorescence measuring system and methods for trace elements

Details for Australian Patent Application No. 2002324849 (hide)

Owner Quality Control, Inc.

Inventors Laurlia, Melvin J; Bachmann, Claus C

Agent Griffith Hack

Pub. Number AU-B-2002324849

PCT Number PCT/US02/27815

PCT Pub. Number WO2003/021244

Priority 60/317,257 04.09.01 US

Filing date 3 September 2002

Wipo publication date 18 March 2003

Acceptance publication date 24 January 2008

International Classifications

G01N 23/223 (2006.01) Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. X-rays, neutrons

G01B 15/06 (2006.01) Measuring arrangements characterised by the use of wave or particle radiation

Event Publications

16 January 2003 Complete Application Filed

  Priority application(s): 60/317,257 04.09.01 US

5 June 2003 Application Open to Public Inspection

  Published as AU-B-2002324849

24 January 2008 Application Accepted

  Published as AU-B-2002324849

22 May 2008 Standard Patent Sealed

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