SEMICONDUCTOR PROGRAMMING AND TESTING METHOD AND APPARATUS

Details for Australian Patent Application No. 2002322328 (hide)

Owner MORGAN AND FINNEGAN, L.L.P., TRUSTEE

Inventors GEFEN, Moshe

Pub. Number AU-A-2002322328

PCT Number PCT/US02/20268

PCT Pub. Number WO2003/003033

Priority 60/300,987 26.06.01 US

Filing date 26 June 2002

Wipo publication date 3 March 2003

International Classifications

G01R 031/00 Arrangements for testing electric properties

Event Publications

16 January 2003 Complete Application Filed

  Priority application(s): 60/300,987 26.06.01 US

15 May 2003 Application Open to Public Inspection

  Published as AU-A-2002322328

11 March 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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