METHOD AND DEVICE FOR DETECTING FLAW OF WORK

Details for Australian Patent Application No. 2002318639 (hide)

Owner NTT ADVANCED TECHNOLOGY CORPORATION TOKYO SEIMITSU CO., LTD.

Inventors KUME, Shigefumi; YOSHIDA, Kouji

Pub. Number AU-A-2002318639

PCT Number PCT/JP02/06986

PCT Pub. Number WO2003/006969

Priority 2001-208869 10.07.01 JP

Filing date 10 July 2002

Wipo publication date 29 January 2003

International Classifications

G01M 011/00 Testing of optical apparatus

G01N 021/88 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Investigating the presence of flaws, defects or contamination

Event Publications

9 January 2003 Complete Application Filed

  Priority application(s): 2001-208869 10.07.01 JP

22 May 2003 Application Open to Public Inspection

  Published as AU-A-2002318639

8 April 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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