IMPROVED INTEGRATED CIRCUIT BURN-IN METHODS AND APPARATUS

Details for Australian Patent Application No. 2002315504 (hide)

Owner INTEL CORPORATION

Inventors PULLEN, David; KACPROWICZ, Richard

Pub. Number AU-A-2002315504

PCT Number PCT/US02/20760

PCT Pub. Number WO2003/005051

Priority 09/897,252 02.07.01 US

Filing date 27 June 2002

Wipo publication date 21 January 2003

International Classifications

G01R 031/316 Arrangements for testing electric properties

G01R 031/28 Arrangements for testing electric properties - Testing of electronic circuits, e.g. by signal tracer

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

2 January 2003 Complete Application Filed

  Priority application(s): 09/897,252 02.07.01 US

22 May 2003 Application Open to Public Inspection

  Published as AU-A-2002315504

18 March 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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