OPTICAL INSPECTION OF ELECTRONIC CIRCUIT BOARDS, WAFERS AND THE LIKE, USING SKELETAL REFERENCE IMAGES AND SEPARATELY PROGRAMMABLE ALIGNMENT TOLERANCE AND DETECTION PARAMETERS

Details for Australian Patent Application No. 2002315418 (hide)

International Classifications

Event Publications

2 January 2003 Complete Application Filed

4 March 2004 Application Open to Public Inspection

Published as AU-A-2002315418

10 March 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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