METHOD AND DEVICE FOR TESTING ELECTRONIC DEVICES

Details for Australian Patent Application No. 2002315364 (hide)

Owner HEATRON, INC.

Inventors GIARDINA, Richard, N.; FETSCHER, Brian, S.; DEUTSCHLANDER, James, G.; MARTTER, Robert, H.; SUNDBERG, Craig, C.

Pub. Number AU-A-2002315364

PCT Number PCT/US02/19434

PCT Pub. Number WO2003/001859

Priority 60/299,632 20.06.01 US

Filing date 19 June 2002

Wipo publication date 8 January 2003

International Classifications

H05K 003/36 Apparatus or processes for manufacturing printed circuits - Assembling printed circuits with other printed circuits

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

H01R 009/00 Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips, terminal blocks

H05K 001/03 Printed circuits - Use of materials for the substrate

H05K 001/00 Printed circuits

G01R 031/02 Arrangements for testing electric properties - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection

Event Publications

2 January 2003 Complete Application Filed

  Priority application(s): 60/299,632 20.06.01 US

19 June 2003 Application Open to Public Inspection

  Published as AU-A-2002315364

11 March 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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