METHODS AND APPARATUS FOR SEMICONDUCTOR TESTING
Details for Australian Patent Application No. 2002312045 (hide)
Event Publications
2 January 2003 Complete Application Filed
Priority application(s): 60/293,577 24.05.01 US; 60/295,188 31.05.01 US; 09/872,195 31.05.01 US; 60/374,328 21.04.02 US
8 May 2003 Application Open to Public Inspection
Published as AU-A-2002312045
11 March 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired
This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.
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