SYSTEM AND METHOD FOR CONTROLLING DEPOSITION PARAMETERS IN PRODUCING A SURFACE TO TUNE THE SURFACE'S PLASMON RESONANCE WAVELENGTH

Details for Australian Patent Application No. 2002305489 (hide)

Owner ZYVEX CORPORATION

Inventors WEIMER, Wayne, A.

Pub. Number AU-A-2002305489

PCT Number PCT/US02/14700

PCT Pub. Number WO2002/090949

Priority 09/852,992 10.05.01 US

Filing date 8 May 2002

Wipo publication date 18 November 2002

International Classifications

G01N 021/65 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light

G01N 021/55 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Specular reflectivity

G01J 003/44 Spectrometry - Raman spectrometry

B41M 003/00 Printing processes to produce particular kinds of printed work, e.g. patterns

Event Publications

19 December 2002 Complete Application Filed

  Priority application(s): 09/852,992 10.05.01 US

1 May 2003 Application Open to Public Inspection

  Published as AU-A-2002305489

26 February 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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