LIQUID CRYSTAL PROCESS DEFECT INSPECTION APPARATUS AND INSPECTION METHOD

Details for Australian Patent Application No. 2002253693 (hide)

Owner SAMSUNG ELECTRONICS CO., LTD.

Inventors CHOO, Dae-Ho; WON, Min-Young; NAM, Hyoo-Hak; JEON, Baek-Keun

Pub. Number AU-A-2002253693

PCT Pub. Number WO2003/036274

Priority 2001/65991 25.10.01 KR

Filing date 22 April 2002

Wipo publication date 6 May 2003

International Classifications

G01N 021/84 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Systems specially adapted for particular applications

G01N 021/88 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Investigating the presence of flaws, defects or contamination

Event Publications

3 July 2003 Application Open to Public Inspection

  Published as AU-A-2002253693

15 July 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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