ELECTRONIC COMPONENT TEST APPARATUS

Details for Australian Patent Application No. 2002253589 (hide)

Owner ADVANTEST CORPORATION

Inventors NAKAMURA, Hiroto

Pub. Number AU-A-2002253589

PCT Pub. Number WO2003/091740

Filing date 25 April 2002

Wipo publication date 10 November 2003

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

Event Publications

18 December 2003 Application Open to Public Inspection

  Published as AU-A-2002253589

13 January 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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