ELECTRONIC COMPONENT TEST APPARATUS

Details for Australian Patent Application No. 2002251536 (hide)

Owner ADVANTEST CORPORATION

Inventors ITO, Akihiko; NAKAMURA, Hiroto

Pub. Number AU-A-2002251536

PCT Pub. Number WO2003/091741

Filing date 25 April 2002

Wipo publication date 10 November 2003

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

Event Publications

18 December 2003 Application Open to Public Inspection

  Published as AU-A-2002251536

13 January 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2002251537-MEDICINES

2002251535-CRYSTAL OF 6-(4-(4-PYRIDYLAMINO)PHENYL)-4, 5-DIHYDRO-3(2H)-PYRIDAZINONE HYDROCHLORIDE TRIHYDRATE