SEMICONDUCTOR TEST SYSTEM AND ASSOCIATED METHODS FOR WAFER LEVEL ACCEPTANCE TESTING

Details for Australian Patent Application No. 2002250528 (hide)

Owner UNIVERSITY OF FLORIDA INTERSIL AMERICAS INC.

Inventors HEMMENWAY, Don, F.; MCCARTY, Chris, A.; EISENSTADT, William, R.; FOX, Robert, M.; CHAWLA, Ravi; JOHNSTON, Jeffrey, M.

Pub. Number AU-A-2002250528

PCT Pub. Number WO2002/082532

Priority Not Given 04.04.02 US; 60/282,011 06.04.01 US

Filing date 5 April 2002

Wipo publication date 21 October 2002

International Classifications

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

Event Publications

10 April 2003 Application Open to Public Inspection

  Published as AU-A-2002250528

19 February 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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