METHOD FOR SCAN TESTING OF DIGITAL CIRCUIT, DIGITAL CIRCUIT AND PROGRAM PRODUCT

Details for Australian Patent Application No. 2002239988 (hide)

Event Publications

13 February 2003 Application Open to Public Inspection

Published as AU-A-2002239988

12 February 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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