ELECTRONIC COMPONENT TESTING APPARATUS

Details for Australian Patent Application No. 2002237553 (hide)

Owner ADVANTEST CORPORATION

Inventors OKUDA, Hiroshi; KIYOKAWA, Toshiyuki; NAKAJIMA, Haruki

Pub. Number AU-A-2002237553

PCT Pub. Number WO2003/075025

Filing date 7 March 2002

Wipo publication date 16 September 2003

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

23 October 2003 Application Open to Public Inspection

  Published as AU-A-2002237553

25 November 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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