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Details for Australian Patent Application No. 2002230197 (hide)

Owner MIYAZAKI, Syuji

Inventors MIYAZAKI, Syuji

Pub. Number AU-A-2002230197

PCT Pub. Number WO2002/065544

Priority 2001-40283 16.02.01 JP

Filing date 8 February 2002

Wipo publication date 28 August 2002

International Classifications

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

G01R 031/28 Arrangements for testing electric properties - Testing of electronic circuits, e.g. by signal tracer

G06F 003/00 Input arrangements for transferring data to be processed into a form capable of being handled by the computer

Event Publications

20 February 2003 Application Open to Public Inspection

  Published as AU-A-2002230197

12 February 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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