ELEMENTAL ANALYSER, SCANNING TRANSMISSION ELECTRON MICROSCOPE, AND ELEMENT ANALYZING METHOD

Details for Australian Patent Application No. 2002212703 (hide)

Owner HITACHI, LTD.

Inventors ISAKOZAWA, Shigeto; KAJI, Kazutoshi; AOYAMA, Takashi; TAYA, Shunroku; TANAKA, Hiroyuki

Pub. Number AU-A-2002212703

PCT Pub. Number WO2003/038418

Filing date 2 November 2001

Wipo publication date 12 May 2003

International Classifications

G01N 023/04 Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. X-rays, neutrons

H01J 037/28 Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof - with scanning beams

Event Publications

10 July 2003 Application Open to Public Inspection

  Published as AU-A-2002212703

22 July 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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